The 300kV spherical aberration corrected transmission electron microscope (JEM-ARM300F2) has been installed and calibrated, and the facility will be available for trial use by faculty and students starting Nov 25.

Instrument specifications:

Model: JEM-ARM300F2 (GRAND ARM2)

Filament Type: Cold Field Emission Gun

Acceleration Voltage: 40–300 kV

TEM Resolution: ≤50 pm (300 kV)

STEM Resolution: ≤53 pm (300 kV)

Camera: TVIPS XF416

Spectrometer: JED-2300T (158 mm² Dual Detectors)

Applications:

The JEM-ARM300F2 is equipped with a unique dual 12-pole spherical aberration corrector and automatic correction software, enabling ultra-high atomic-level resolution imaging with ease.

The integration of large-area dual EDS detectors facilitates efficient elemental analysis. The TVIPS XF416 camera allows real-time observation at a 48 fps frame rate with full 4k x 4k resolution.

Important notes:

Sample Requirements: Samples must be non-magnetic, with a thickness of less than 50 nanometers, and pre-treated to remove surface contamination.

Not all samples are suitable for aberration-corrected electron microscopy to achieve ideal results. It is recommended to screen samples using a conventional transmission electron microscope and discuss feasibility with the lab instructor.

The facility offers high-resolution and atomic imaging capabilities.

To schedule an appointment, please visit: http://facility.whu.edu.cn

Location: Room 101E, Blue Moon Hi-tech Building.

Contact: Mr Wu at 18163510103